Glass Inclusion Inspection System

A Novel Technique for Detecting Impurities in Toughened Glass Panels

Temasek Polytechnic staffs and SIMTech researchers are in collaboration to develop a Glass Inclusion Inspection System ( GIIS ), a novel and highly effective technique for detecting impurities in toughened glass panels.

Toughened glass panels are widely installed in high-rise buildings. However, there is a growing need for regular inspection to detect the presence of detrimental inclusions known as nickel sulfide (NiS). NiS is a residue in the manufacture of toughened glass panels. It exists in about 20% of toughened glass panels. At room temperature, it can expand by 4% in volume over time. An inclusion size of greater than 110µm will cause the glass to crack or shatter resulting in property damages or possible injuries.

The GIIS system will introduces light into the toughened glass panel. Any inclusion in the glass will cause the light to scatter, resembling a sparkling star in the dark background, and this image will be picked up by the vision system for further details inspection and analysis by a human operators.

The GIIS is a semi-automatic system, may be deployed in factory for QC inspection, or outdoor inspection on existing building glass panel.